Semiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi System

After-sales Service: 1 Year
Demoulding: Automatic
Condition: New

Products Details

  • Overview
  • Product Description
Overview

Basic Info.

Model NO.
MH
Certification
CE
Warranty
24 Months
Automatic Grade
Automatic
Installation
Vertical
Driven Type
Electric
Mould Life
>1,000,000 Shots
Product Type
6",8",12" Wafer, 2.5D/3D Packaging
3D Inspection Project
Bump Height, Bump Coplanality
Cassette &Transmission Method
8"Smif , 12" Foup or Combination
Precision
0.55um/Pixel
Trademark
MINDER-HIGHTECH
Origin
China
Production Capacity
1000

Product Description

Product Description

Wafer 2D&3D  Optical Inspection AOI System

Semiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSemiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSemiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSemiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSemiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSemiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi System
Semiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSemiconductor Manufacture Optical Measurement Testing Autonomous Optical Wafer 2D&3D Inspection Aoi SystemSoftware Introduction
1.Supports multi-level permissions and permission operation log functions
2.The equipment menu bar covers a wide range of functions
3.Automatically generates mapping and production reports
4.Displays task status in real-time.
5.Combines traditional algorithms with Al for fast and accurate defect
identification.
Technical Parameter
Project Content
Product Type 6",8",12" wafer, 2.5D/3D packaging
2D Inspection ltems Foreign objects, residual glue, particles, scratches, cracks, contamination, CP deviation, excessive needle marks, etc.
2D Metrology Bump diameter, needle mark coordinates, RDL and TSV metrology, etc.
3D Inspection Project Bump height, Bump coplanality
Cassette &Transmission Method 8"SMIF , 12" FOUP or combination
Lens and Resolution 2x(2.75um)13.5x(1.57um)5x(1.1um)17.5x(0.73um)110x(0.55um)
Precision 0.55um/pixel
Optional and Customized Double sided OCR,3D module, supported by E84

 

 

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